E3 レーザ超音波による高温下でのき裂測定(測定技術)  [in Japanese] E3 Crack Measurements by Laser Ultrasound at High Temperatures  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (13), 125-126, 1992-11-30  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460500
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS