H2 1次元熱伝導モデルに基づいたSiウェハ上クラックの光音響検出シミュレーション(光音響技術)  [in Japanese] H2 Simulation of Photoacoustic Detection of Microcracks on Silicon Wafers Based on One-Dimensional Thermal-Diffusion Model  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (13), 243-244, 1992-11-30  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460557
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS