H3 Photothermal Rate-Window Spectrometry. A New Non-contact Method for the Thermal Diffusivity Measurement of Ultrahigh Thermal Conductors: CVD Diamonds

    • Chen Zhuohui
    • Photothermal and Optoelectronic Diagnostics Laboratory Department of Mechanical Engineering, and Ontario Laser and Lightwave Research Center University of Toronto
    • Mandelis Andreas
    • Photothermal and Optoelectronic Diagnostics Laboratory Department of Mechanical Engineering, and Ontario Laser and Lightwave Research Center University of Toronto

Abstract

A new non-contact photothermal rate-window spectrometry for measuring the thermal diffusion dynamics is presented in this paper. The lock-in rate-window method, which has a significant advantage over the boxcar method in terms of signal-to-noise ratio, is ideally suitable for non-contact thermal and electronic measurements with low signal levels, especially at low temperatures where the PTR signal is small.

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (13), 245-246, 1992-11-30  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460558
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    ENG
  • Databases :
    NII-ELS