B2 超高周波平面超音波による精密機械系の移動特性評価法 : 直線集束ビーム超音波顕微鏡への適用(超音波測定技術)  [in Japanese] B2 A measurement method of movement characteristics of precision mechanical-translation stages using ultrasonic plane waves and its application to a z-stage of the line-focus-beam acoustic microscope  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (14), 11-12, 1993-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460577
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS