C1 トンネル音響顕微鏡によるPZT薄膜の観察(超音波非破壊評価)  [in Japanese] C1 Observations of PZT-thin films by tunneling acoustic microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (14), 23-24, 1993-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007460581
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS