C3 試料を超音波振動させる原子間力顕微鏡による表面下の映像法(超音波非破壊評価)  [in Japanese] C3 Subsurface imaging by atomic force microscope with ultrasonic vibration of samples  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (14), 27-28, 1993-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460583
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS