PB7 CuZn薄片試料の内部摩擦の測定(ポスタセッションB-概要講演・展示)  [in Japanese] PB7 Measurement of Thin CuZn Specimen  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (14), 145-146, 1993-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460637
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS