A-5 電子線超音波顕微鏡による積層欠陥(OSF)の観察(A.超音波非破壊評価)  [in Japanese] A-5 An Observation of Oxidation Induced Stacking Faults Using Electron-Acoustic Microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (15), 9-10, 1994-11-28  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460710
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS