PA-7 電子線超音波顕微鏡によるMOS-LSIの非破壊・内部観察(P.ポスターセッションA-概要講演・展示)  [in Japanese] PA-7 Nondestructive Internal Observation of MOS-LSI Chip Using Electron-Acoustic Microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (15), 43-44, 1994-11-28  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460726
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS