PB-19 Ti添加Al-SAW電極の耐電力性に関するIIDTを用いた検討(P.ポスターセッションB-概要講演・展示)  [in Japanese] PB-19 Study on Power Durability of Ti-added Al SAW-Electrodes by Using IIDT-filter TEGs  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (15), 199-200, 1994-11-28  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460804
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS