J-4 Evaluation of Temperature Dependence of Characteristic Material Parameters at Semiconductor Surface by Transient Reflecting Grating Technique

J-4 過渡反射格子法による半導体表面物性の温度依存性の評価(J.光音響技術) [in Japanese] J-4 Evaluation of Temperature Dependence of Characteristic Material Parameters at Semiconductor Surface by Transient Reflecting Grating Technique [in Japanese]

Symposium on ultrasonic electronics [List of Volumes]

Symposium on ultrasonic electronics (15), 295-296, 1994-11-28 [Table of Contents]

Steering committee of symposium on ultrasonic electronics