OA4 TeO_2の顕微ブリルアン散乱 : 庄力依存性(超音波物性)  [in Japanese] OA4 Microscopic Brillouin Scattering Study on TeO_2-Pressure dependence  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (16), 7-8, 1995-11-27  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460862
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS