PD16 高温媒体の面外変位計測と定量的AE原波形解析による溶融銀ろう割れのメカニズム(ポスターセッション1-概要講演・展示)  [in Japanese] PD16 Monitoring of Out-plane Displacement of Hot Medium and Mechanism of Fused Solder Cracking by Estimated Quantitative AE Source Wave Analysis  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (16), 51-52, 1995-11-27  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460883
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS