PF4 層状構造漏洩弾性表面波トランスデューサを用いた振動変位の測定(ポスターセッション4-概要講演・展示)  [in Japanese] PF4 Vibration Displacement Measurement Using a Layered-Structure Leaky Wave Interdigital Transducer  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (16), 179-180, 1995-11-27  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460947
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS