PG1 走査型静電容量顕微鏡による誘電率分布の映像化(ポスターセッション1)  [in Japanese] PG1 Imaging of dielectric constant distribution by Scanning Capacitance Microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (17), 55-56, 1996-10-23  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007461032
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS