OA2 多孔質シリコンの光音響分光によるバンドギャップの評価(基礎・物性)  [in Japanese] OA2 Band Gap of Porous Silicon Estimated by Photoacoustic Spectra  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (18), 111-112, 1997-11-12  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007461239
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS