OF4 超音波原子間力顕微鏡による弾性率の定量評価(非破壊評価)  [in Japanese] OF4 Quantitative elasticity characterization by ultrasonic atomic force microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (18), 223-224, 1997-11-12  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007461294
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS