OE11 超音波原子間力顕微鏡による接触弾性の逆問題解析(材料・評価,SAWデバイス,口頭発表)  [in Japanese] OE11 Inverse Analysis of Contact Stiffness by Ultrasonic Atomic Force Microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (19), 27-28, 1998-11-26  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007461321
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS