PC6 欠陥を有する溝付き平板の光音響顕微鏡による観察と非破壊評価(光-超音波エレクトロニクス,ポスターセッション1)  [in Japanese] PC6 Observation and Nondestructive Evaluation of Grooved Plane with defect by Photoacoustic Microscope  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (19), 69-70, 1998-11-26  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007461342
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS