PF2 強力空中超音波を利用した表面残留微粒子の測定(強力超音波,ポスターセッション1)  [in Japanese] PF2 Measurement of Residual Particles on the Metal Surface Using High Intensity Aerial Ultrasonic Waves  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (19), 93-94, 1998-11-26  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007461354
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS