C-4 直線集束ビーム超音波顕微鏡によるSAWデバイス用LiNbO_3,LiTaO_3単結晶基板の評価・選別  [in Japanese] C-4 Characterization of LiNbO_3 and LiTaO_3 substrates for SAW devices by LFB acoustic microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (20), 27-28, 1999-11-17  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007461466
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS