F-3 走査型非線形誘電率顕微鏡を用いた定量計測  [in Japanese] F-3 Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (20), 303-304, 1999-11-17  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007461603
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS