2-PF-4 実効音響アドミタンスを用いた薄膜の弾性的性質の評価(2-P.ポスターセッション(概要講演))  [in Japanese] 2-PF-4 Analysis of Elastic properties of Thin films by Effective Acoustic Admittance  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (10), 157-158, 1989-11-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007463929
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS