OD05 超音波原子間力顕微鏡による表面下の欠陥評価(光超音波エレクトロニクス,非破壊検査)  [in Japanese] OD05 Evaluation of subsurface defects by ultrasonic atomic force microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (21), 37-38, 2000-11-06  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007463973
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS