OD06 内部微小き裂による二次高調波の発生の有限要素法シミュレーション及び実験との比較(光超音波エレクトロニクス,非破壊検査)  [in Japanese] OD06 Numerical simulation of harmonic generation at microcracks and comparison with the experiment  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (21), 39-40, 2000-11-06  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007463974
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS