QD01 枝分かれ複合欠陥の光音響顕微鏡による観察と非破壊評価(ポスターセッションII)  [in Japanese] QD01 Observation of branched complicated defect and its nondestructive evaluation by photoacoustic microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (21), 207-208, 2000-11-06  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007464058
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS