QD08 レーザーインパクト法による構造物の非接触評価(ポスターセッションII)  [in Japanese] QD08 Non-contact evaluation of reliability of infrastructures by laser impact method  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (21), 221-222, 2000-11-06  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Cited by:  1

You must have a user ID to see the cited references.If you already have a user ID, please click "Login" to access the info.New users can click "Sign Up" to register for an user ID.

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007464065
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Article Type :
    Proceedings
  • Databases :
    CJPref  NII-ELS