QF01 La_3Ga_<5.5>Nb_<0.5>O_<14>基板EWD-RDTの特性解析(ポスターセッションII)  [in Japanese] QF01 An Analysis of EWD-RDT on a La_3Ga_<5.5>Nb_<0.5>O_<14> Substrate  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (21), 249-250, 2000-11-06  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007464079
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS