RK21 円形走査型超音波断層撮像法における散乱波の低周波成分の予測と定量的評価(ポスターセッションIII)  [in Japanese] RK21 Quantitative Evaluation and Prediction of Low-Frequency Scattering in A Circular-Scanning Ultrasonic Diffraction Tomography  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (21), 363-364, 2000-11-06  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007464136
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS