C-5 超音波原子間力顕微鏡によるナノスケールの材料評価(光-超音波エレクトロニクス・非破壊検査,口頭発表) [in Japanese] C-5 Nanoscale material evaluation by ultrasonic atomic force microscopy [in Japanese]

- 辻俊宏 Tsuji Toshihiro
- 東北大院・工 Department of Material Processing, Graduate School of Engineering, Tohoku University
- 入浜洋 Irihama Hiroshi
- 東北大院・工 Department of Material Processing, Graduate School of Engineering, Tohoku University
- 山中一司 Yamanaka Kazushi
- 東北大院・工 Department of Material Processing, Graduate School of Engineering, Tohoku University

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Journal

Symposium on ultrasonic electronics [List of Volumes]

Symposium on ultrasonic electronics (22), 29-30, 2001-11-07 [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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NII Article ID (NAID) :
110007464162
NII NACSIS-CAT ID (NCID) :
AN10578660
Text Lang :
JPN
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