P1-26 光音響顕微鏡による内部欠陥形状の測定(ポスターセッション1,ポスター発表)  [in Japanese] P1-26 Measurement of subsurface defect shape by photoacoustic microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (22), 115-116, 2001-11-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007464205
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS