P1-23 The Measurement for Anneal Effect of Si-Ge-Au Amorphous Thin Film with Anomalously Large Thermoelectric Power by Using Photoacoustic Spectroscopy

P1-23 巨大熱電能を示すアモルファスSi-Ge-Au薄膜のPASによる熱処理による変化の評価(ポスターセッション1,ポスター発表) [in Japanese] P1-23 The Measurement for Anneal Effect of Si-Ge-Au Amorphous Thin Film with Anomalously Large Thermoelectric Power by Using Photoacoustic Spectroscopy [in Japanese]

- 岡本庸一 Okamoto Yoichi
- 防衛大・材料 Dept. of Materials Science and Engineering, National Defense Academy
- 宮田亜希子 Miyata Akiko
- 防衛大・材料 Dept. of Materials Science and Engineering, National Defense Academy
- 佐藤義和 Sato Yoshikazu
- 防衛大・材料 Dept. of Materials Science and Engineering, National Defense Academy
- 滝口裕章 Takiguti Hiroaki
- 防衛大・材料 Dept. of Materials Science and Engineering, National Defense Academy
- 河原敏男 Kawahara Toshio
- 防衛大・材料 Dept. of Materials Science and Engineering, National Defense Academy
- 守本純 Morimoto Jun
- 防衛大・材料 Dept. of Materials Science and Engineering, National Defense Academy

Symposium on ultrasonic electronics [List of Volumes]

Symposium on ultrasonic electronics (23), 53-54, 2002-11-07 [Table of Contents]

Steering committee of symposium on ultrasonic electronics