P1-31 圧電素子光熱分光法とフォトルミネッセンス法による4H-SiC単結晶中の欠陥評価(ポスターセッション1,ポスター発表) [in Japanese] P1-31 The evaluation of defects in 4H-SiC single crystal by means of Piezoelectric Photo-thermal spectroscopy and Photoluminecsence [in Japanese]

- 多田晋 Tada Susumu
- 宮崎大・工 Department of Applied Physics
- 境健太郎 Sakai Kentaro
- 宮崎大・機器分析 Materials Research Center, Miyazaki University
- 福山敦彦 Fukuyama Atsuhiko
- 宮崎大・工 Department of Applied Physics
- 碇哲雄 Ikari Tetsuo
- 宮崎大・工 Department of Electrical and Electronic Engineering, Miyazaki University

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Symposium on ultrasonic electronics [List of Volumes]

Symposium on ultrasonic electronics (23), 69-70, 2002-11-07 [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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NII Article ID (NAID) :
110007464392
NII NACSIS-CAT ID (NCID) :
AN10578660
Text Lang :
JPN
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