Detection of Label-Free T4-DNA Molecules Using SPR Technique

  • OKUNO Hiroki
    the Department of Intelligent Mechanical Systems Engineering, Faculty of Engineering, Kagawa University
  • NISHIOKA Ayami
    the Department of Intelligent Mechanical Systems Engineering, Faculty of Engineering, Kagawa University
  • HOSOGI Maho
    the Department of Intelligent Mechanical Systems Engineering, Faculty of Engineering, Kagawa University
  • OOHIRA Fumikazu
    the Department of Intelligent Mechanical Systems Engineering, Faculty of Engineering, Kagawa University
  • HASHIGUCHI Gen
    the Department of Intelligent Mechanical Systems Engineering, Faculty of Engineering, Kagawa University

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抄録

In this paper, we propose a new method for detecting label-free T4-DNA molecules quantitatively using a surface plasmon resonance (SPR) technique on a gold thin film. We used a solution that dissolved T4-DNA molecules in pure water, and examined the relationship between DNA concentration change and SPR angle change in the solution. As a result, it was confirmed that the SPR angle change increased with increasing DNA concentration change. Therefore, it was feasible to detect the DNA concentration change using the SPR technique. Furthermore, to examine and detect a single or a few DNA molecule, we tried to fabricate an SPR chip in which SPR area is narrowed so that it has the same effect as focusing the beam. To narrow the SPR area, we decreased the area of gold thin film in this chip, and, to reflect light from only the area of gold thin film, the area without a gold thin film was micromachined to increase its unevenness for the reduction of light reflection. By the above-mentioned method, we examined the possibility of detecting a label-free DNA molecule using the SPR technique.

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詳細情報 詳細情報について

  • CRID
    1572824502369343232
  • NII論文ID
    110007519564
  • NII書誌ID
    AA10826283
  • ISSN
    09168524
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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