@article{PARKJae-Young:2010-06-23,
author="PARK, Jae-Young and KIM, Dae-Woo and SON, Young-Sang and HA, Jong-Chan and SONG, Jong-Kyu and JANG, Chang-Soo and JUNG, Won-Young",
title="A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process(Session 7B : Si IC and Circuit Technology)",
journal="Technical report of IEICE. SDM",
ISSN="09135685",
publisher="The Institute of Electronics, Information and Communication Engineers",
year="2010",
month="jun",
volume="110",
number="110",
pages="269-274",
URL="http://ci.nii.ac.jp/naid/110007890323/en/",
DOI="",
}