銀系接点低速開離時の短時間アークに関する一検討  [in Japanese] A Study on Short-Time Arc at Slowly Breaking Silver-Compound Contacts  [in Japanese]

Abstract

電気接点の開閉時に発生するアーク放電は電磁ノイズの発生原因となる.発生した電磁ノイズは電子機器を妨害する可能性があるため,電気接点を設計する上でElectromagnetic compatibility(EMC)は寿命,信頼性などと同様に重要な評価パラメータである.本論文では,銀系接点低速開離時に発生するGHz帯までの電磁ノイズの特性を開離現象と対応させて明らかにするために,ノイズの発生領域として1つめの短時間アーク放電に注目し,純粋なAg接点と化合物系のAg_<88.3>SnO_2接点の短時間アーク波形の比較による特徴抽出を試みた.Ag_<88.3>SnO_2接点に関する実験では,開離1回目には短時間アーク放電の発生が確認出来たが,1回目の開離から継続時間が4s程度と長い金属相及びガス相アーク放電も生じた.そして,2回目以降の開離では短時間アークは生じなかった.一方,Ag接点では開離回数7から8回目以降で継続時間が急激に長くなる現象が確認できた.高速カメラによる放電状態の観測から,短時間アーク放電による表面劣化の違いの影響の可能性が示唆された.

Arc discharge generated by breaking electrical contact is considered as a main source of an undesired electromagnetic (EM) noise. Since the EM noise resulting from the arc discharge disturbs other electric devices, electromagnetic compatibility (EMC), as well as lifetime and reliability, are important parameters for the evaluation of electrical contact. In order to clarify mechanism of generation of the EM noise, feature extraction of bridge and short-time arc waveforms generated by slowly breaking Ag and Ag_<88.3>SnO_2 contacts is discussed experimentally in this paper. The short-time arc in the "Ag_<88.3>SnO_2" case is obserbed when the first time operation. As operation numbers increase, arc duration of the "Ag" case becomes longer rapidly. It seems like the dominant factor of deterioration of surface of contact is short-time duration arc, and it affects the operation number dependencies of Ag and Ag_<88.3>SnO_2 materials.

Journal

IEICE technical report. EMD   [List of Volumes]

IEICE technical report. EMD 110(51), 43-48, 2010-05-14  [Table of Contents]

The Institute of Electronics, Information and Communication Engineers

References:  14

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Codes

  • NII Article ID (NAID) :
    110008002236
  • NII NACSIS-CAT ID (NCID) :
    AN10383978
  • Text Lang :
    JPN
  • Article Type :
    ART
  • ISSN :
    09135685
  • NDL Article ID :
    10712647
  • NDL Source Classification :
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL Call No. :
    Z16-940
  • Databases :
    CJP  NDL  NII-ELS 

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