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Abstract
半導体バルク結晶は,環境とエネルギーの喫緊の問題に対しての解を与えることが可能な材料の一つであり,今後も重要な材料である.この半導体バルク結晶を用いた電子・光デバイスを社会に普及させるためには,可能な限り結晶の成長速度を増加させる必要がある.結晶の成長速度は,過飽和度や過冷却度や結晶学的な方位,そして欠陥や不純物の有無等により決定される.さらには,結晶表面の構造にも影響される.結晶成長速度の向上のためには,結晶成長機構の定量的な理解が必要となる.本報告では,シリコンの融液成長とSiCの昇華法による結晶成長法に焦点を当て,半導体バルク結晶の成長速度に関する総合報告を行う.
This paper reports the determination factor of velocity of crystal growth of silicon and silicon carbide (SiC). We studied growth methods of Czochralski and physical vapor deposition for silicon and SiC, respectively. The growth velocity of silicon is determined by heat flux conservation based on temperature gradient in both a crystal and a melt since growth interface is formed by a rough interface. Crystal growth of SiC is based on spies transport from a source to a seed crystal. Therefore, the growth velocity is determined by a supersaturation of the species near the seed crystal. The range of super saturation is about 5 to 20% in the case of sublimation method of SiC.
Journal
- Journal of the Japanese Association of Crystal Growth [List of Volumes]
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Journal of the Japanese Association of Crystal Growth 38(2), 86-92, 2011-07-00 [Table of Contents]
The Japanese Association for Crystal Growth (JACG)
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