書誌事項
- タイトル別名
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- 1505 Effect of thickness on creep property of freestanding Al nano-filnis
抄録
To evaluate the creep property of nano or submicron meter-thick metallic films, we develop a method for fabricating a freestanding-film specimen and a uniaxial creep testing for the specimen. Using the methods we conduct creep experiments for Al films with thicknesses of about 200 and 370 nm at a room temperature (296 ± 2 K) under applied stresses ranging from 30 to 120 MPa. The results show a typical creep behavior consisted of transient, steady state and accelerating creep stages. Strain rate at the steady-state increases with an increase in applied stress; the power law relationship, i.e. Norton law, is observed between them. Little significant differences are observed in the steady state behavior between 200 and 370 nm-thick specimens.
収録刊行物
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- M&M材料力学カンファレンス
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M&M材料力学カンファレンス 2010 (0), 84-85, 2010
一般社団法人 日本機械学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390001205871745920
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- NII論文ID
- 110008741005
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- ISSN
- 24242845
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可