ICONE15-10425 DEVELOPMENT OF CONTAMINATION MONITORS APPLICABLE TO VARIOUS SITUATIONS ENCOUNTERED IN ON-SITE MEASUREMENT

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  • Goto Tetsuo
    Technology Development Division, Toshiba Power Systems Radiation Techno-Service co., ltd
  • Sumita Akio
    Power and Industrial Systems Research and Development Center, Power Systems Company, Toshiba Corporation
  • Makino Shunichiro
    Power and Industrial Systems Research and Development Center, Power Systems Company, Toshiba Corporation
  • Maekawa Tatsuyuki
    Power and Industrial Systems Research and Development Center, Power Systems Company, Toshiba Corporation
  • Yoshimura Yukio
    Nuclear Energy Division, Power Systems Company, Toshiba Corporation

抄録

When the clearance is judged by the on-site surface contamination measurement of large-scale objects by beta-ray measurement, various needs arise in such viewpoints as the background compensation for the gamma ray self-shielding or the difficulty in measurement of the narrow apertures of objects, etc. To correspond to these needs, the wavelength shifting technique combined with plastic scintillators have been applied to various types of contamination survey meters according to the waste form or the surface condition of the objects. The survey meters are found to be useful to be applied for surface contamination measurement in various situations encountered in on-site measurement

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