B011 Experiment of Polarization Forces in Scanning Electrostatic Force Microscopy for Measuring Surface Profile of Dielectric
-
- HE Gaofa
- College of Mechanical and Power Engineering, Chongqing University of Science and Technology:Nano-metrology and Control Laboratory, Department of Nanomechanics, Tohoku University
-
- JIA Zhigang
- Nano-metrology and Control Laboratory, Department of Nanomechanics, Tohoku University
-
- ITO So
- Nano-metrology and Control Laboratory, Department of Nanomechanics, Tohoku University
-
- SHIMIZU Yuki
- Nano-metrology and Control Laboratory, Department of Nanomechanics, Tohoku University
-
- GAO Wei
- Nano-metrology and Control Laboratory, Department of Nanomechanics, Tohoku University
抄録
For measuring the surface profile of many micro-optical components with complicated shapes, which are made of non-conductive material, the electrostatic force microscopy (EFM) was recommended. The relationship between the polarization force and the tip-to-sample distance was analyzed based on dielectric polarization theory. The prototype of the scanning electrostatic force microscopy was built. The force curves of different samples with different materials and surface shapes were detected by the EFM prototype. Both theoretical analysis and the experimental results demonstrated that the EFM system can be used to measure the surface profile of non-conductor.
収録刊行物
-
- Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21
-
Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21 2013.7 (0), 200-203, 2013
一般社団法人 日本機械学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390001205899288064
-
- NII論文ID
- 110009973397
-
- ISSN
- 24243086
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可