16pCA-4 Angle resolved photoelectron spectroscopy on graphene on the nanofacets on the vicinal SiC(0001) surfaces

• Iimori T.

  ISSP, Univ. of Tokyo

• Nakatsuji K.

  Dep. of Material Sci. and Eng., Tokyo Institute of Technology

• Miyamachi T.

  ISSP, Univ. of Tokyo

• Ienaga K.

  ISSP, Univ. of Tokyo

• Kim S.

  ISSP, Univ. of Tokyo

• Tamura T.

  ISSP, Univ. of Tokyo

• Toyohisa S.

  ISSP, Univ. of Tokyo

• Fukuma K.

  Faculty of Engineering, Kyushu Univ.

• Morita K.

  Faculty of Engineering, Kyushu Univ.

• Kajiwara T.

  Faculty of Engineering, Kyushu Univ.

• Hayashi S.

  Faculty of Engineering, Kyushu Univ.

• Visikovsliy Anton

  Faculty of Engineering, Kyushu Univ.

• Tanaka S.

  Faculty of Engineering, Kyushu Univ.

• Mase K.

  KEK-IMSS

• Komori F.

  ISSP, Univ. of Tokyo

Bibliographic Information

Other Title

• 16pCA-4 SiC(0001)表面上のナノファセットに形成したグラフェンの光電子分光

Journal

• Meeting Abstracts of the Physical Society of Japan

  Meeting Abstracts of the Physical Society of Japan 70.2 (0), 2239-, 2015

  The Physical Society of Japan

Details

• CRID: 1390282680931176832
• NII Article ID: 110010029833
• DOI: 10.11316/jpsgaiyo.70.2.0_2239
• ISSN: 21890803
• Text Lang: ja
• Data Source:
  • JaLC
  • CiNii Articles