A Least-Squares Method for Unfolding Convolution Products in X-ray Diffraction Line Profiles

• Yokoyama Fumiyoshi

抄録

A deconvolution method for the X-ray diffraction line profile is proposed, which is based on the conventional least-squares method. The true profile is assumed to be a functional form. The numerical values of parameters of the function assumed are determined so that the calculated profile, which is a convolution of the function and the instrumental profile, has a minimum deviation from the observed one. The method is illustrated by analysis of the X-ray powder diffraction profile of sodium chloride 222 reflexion under the assumption that the true profile is a Gaussian or a Cauchy function.

収録刊行物

• Memoirs of the School of Engineering, Okayama University

  Memoirs of the School of Engineering, Okayama University 16 (2), 1-16, 1982-03-29

  岡山大学工学部

詳細情報

• CRID: 1390572174501660288
• NII論文ID: 120002307445
• NII書誌ID: AA00733903
• ISSN: 04750071
• DOI: 10.18926/15804
• Web Site: https://ousar.lib.okayama-u.ac.jp/15804
• 本文言語コード: en
• データソース種別:
  • JaLC
  • IRDB
  • CiNii Articles