Characterization of structural dynamics of VO2 thin film on c-Al2O3 using in-air time-resolved x-ray diffraction

• Hada, Masaki

• Okimura, Kunio

• Matsuo, Jiro

Abstract

The lattice motion and displacement of atoms in the unit cell in vanadium dioxide (VO2) grown on c-Al2O3 were characterized by static and time-resolved x-ray diffraction (XRD) measurements. The monoclinic-tetragonal phase transition of the VO2 unit cell and the twist motion of vanadium atoms in the unit cell were observed. The time-resolved XRD measurements were performed in air using a tabletop high-repetition femtosecond laser. The results obtained from the time-resolved XRD measurements suggested that the unit cell of the low-temperature monoclinic VO2 transformed into the high-temperature tetragonal phase extremely rapidly (within 25 ps); however, the atoms in the unit cell fluctuated or vibrated about the center of the tetragonal coordinates, which abated within ∼100 ps. Thus, the time-resolved XRD measurements of the Bragg angle, intensity, and width of the diffraction lines simultaneously revealed the phase transition of VO2 and the atomic motion in the unit cell.

Journal

• Physical Review B

  Physical Review B 82 (15), 2010-10

  The American Physical Society

Details

• CRID: 1050001202301302272
• NII Article ID: 120002661515
• NII Book ID: AA11187113
• ISSN: 10980121
• HANDLE: 2433/131852
• Text Lang: en
• Article Type: journal article
• Data Source:
  • IRDB
  • CiNii Articles