On the critical thickness and wavelength of a condensing thin liquid film in a binary vapor mixture system

• Kanatani Kentaro

抄録

We study the linear stability of a condensing thin liquid lm of a binary vapormixture by solving directly the bulk equations of the gas phase. The bound-ary layer of a nite thickness is introduced above the liquid lm, within whichthe variables are disturbed. The dynamics of the liquid lm is described bythe long-wave equation. The neutral stability condition predicts the exis-tence of a critical thickness below which a at lm is stable due to the massgain e ect. However, if we consider the thickening of the liquid lm by con-densation, the relative neutral stability can be de ned such that the growthrate of a disturbance is equal to that of the basic lm thickness. The criticalthickness and wavenumber obtained from the relative neutral stability con-dition signi cantly change from the original ones. Employing the asymptoticanalysis for large wavenumbers, the critical thickness and wavelength arenumerically calculated for the water-ethanol system. Their dependence onthe boundary layer thickness, temperature and ambient vapor concentrationis investigated. The critical wavelength obtained from our theory has thesame trend in the temperature and concentration as the initial drop distanceobserved in the experiment.

収録刊行物

• International journal of heat and mass transfer

  International journal of heat and mass transfer 80 199-205, 2015-01

キーワード

• Marangoni dropwise condensation
• Binary mixture
• Stability analysis
• Thin liquid film

詳細情報

• CRID: 1050845762669324032
• NII論文ID: 120005521560
• NII書誌ID: AA00680396
• ISSN: 00179310
• Web Site: http://hdl.handle.net/10131/8836
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles