A high-temperature <i>in situ</i> cell with a large solid angle for fluorescence X-ray absorption fine structure measurement

• Murata, Naoyoshi

• Kobayashi, Makoto

• Okada, Yukari

• Suzuki, Takuya

• Nitani, Hiroaki

• Niwa, Yasuhiro

• Abe, Hitoshi

• Wada, Takahiro

• Mukai, Shingo

• Uehara, Hiromitsu

• Ariga, Hiroko

• Takakusagi, Satoru

• Asakura, Kiyotaka

書誌事項

タイトル別名

• A high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure measurement

抄録

We present the design and performance of a high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure (XAFS) spectra. The cell has a large fluorescence XAFS window (116 mm(phi)) near the sample in the cell, realizing a large half-cone angle of 56 degrees. We use a small heater (25 x 35 mm(2)) to heat the sample locally to 873 K. We measured a Pt-SnO2 thin layer on a Si substrate at reaction conditions having a high activity. In situ measurement enables the analysis of the difference XAFS spectra between before and during the reaction to reveal the structure change during the operation. (C) 2015 AIP Publishing LLC.

収録刊行物

• Review of scientific instruments

  Review of scientific instruments 86 (3), 034102-1-034102-6, 2015-03

  American Institute of Physics

キーワード

• Instrumentation

詳細情報

• CRID: 1050564288971601792
• NII論文ID: 120005611264
• DOI: 10.1063/1.4914459
• ISSN: 10897623
• ISSN: 00346748
• HANDLE: 2115/59168
• Web Site: https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/1.4914459/15822670/034102_1_online.pdf
• 本文言語コード: en
• 資料種別: journal article
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