書誌事項
- タイトル別名
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- Preparation and Electrical Properties of Zn3In2O6 Thin Films
- Zn3In2O6 ハクマク ノ ジョウチャク ト デンキテキ セイシツ
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抄録
Using a Zn3In2O6 target, zinc-indium oxide thin films were prepared by rf magnetron sputtering at different substrate temperatures. The influence of the substrate temperature on the structure, Zn: In ratio, and optical, electrical and thermoelectric properties were studied. C-axis oriented thin films were deposited. The ratio of zinc to indium decreased with increasing the substrate temperature. An average transmittance of about 80% in the visible range was obtained. Conductivity of the films increased with increasing the temperature. The Seebeck coefficient was largest for the films deposited at room temperature. The films deposited at 500°C showed the highest power factor of PF=8.21×10−5 (W/mK2).
収録刊行物
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- 粉体および粉末冶金
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粉体および粉末冶金 54 (2), 121-125, 2007
一般社団法人 粉体粉末冶金協会
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詳細情報 詳細情報について
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- CRID
- 1390282681283593600
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- NII論文ID
- 130000057963
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- NII書誌ID
- AN00222724
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- COI
- 1:CAS:528:DC%2BD2sXjt1CqtL0%3D
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- ISSN
- 18809014
- 05328799
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- NDL書誌ID
- 8728005
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可