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- Nagoshi Masayasu
- Steel Research Laboratory, JFE Steel Corporation
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- Aoyama Tomohiro
- Steel Research Laboratory, JFE Steel Corporation
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- Tanaka Yuji
- Steel Research Laboratory, JFE Steel Corporation
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- Ishida Tomoharu
- Steel Research Laboratory, JFE Steel Corporation
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- Kinoshiro Satoshi
- Steel Research Laboratory, JFE Steel Corporation
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- Kobayashi Katsumi
- Photon Factory, KEK
抄録
X-ray fluorescence (XRF) yield x-ray absorption fine structures (XAFS) have been investigated in terms of quantitative analysis for steel sheets containing 31–2100 ppm of Nb. Nb concentrations in the samples were determined with high accuracy from the height of the K-edge jump. The detection limit was estimated down to the single digit ppm range. The combination of this technique with the conventional extended x-ray absorption fine structure (EXAFS) analysis for an identical XAFS spectrum provides both quantity and chemical state information of trace elements in the given volume of steel samples.
収録刊行物
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- ISIJ International
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ISIJ International 53 (12), 2197-2200, 2013
一般社団法人 日本鉄鋼協会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282681464915584
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- NII論文ID
- 130003392810
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- COI
- 1:CAS:528:DC%2BC2cXjsFCk
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- ISSN
- 13475460
- 09151559
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可