Influence of the Difference of Driving Method for Device Characteristics of an OLED

• Kubo Hiroyuki

  Hachinohe Institute of Technology

• Takahashi Erika

  Hachinohe Institute of Technology

• Kawahara Yuichiro

  Hachinohe Institute of Technology

• Sasaki Takanori

  Hachinohe Institute of Technology

• Fujita Shigetaka

  Hachinohe Institute of Technology

抄録

As a phenomenon accompanied by device degradation of OLEDs (organic light emitting diode), our studies confirmed that the ITO (indium-tin oxide) component is diffused into the organic layer by a direct current voltage. This study discusses the pulse driving conditions under which this phenomenon is less likely to occur, aiming to improve the OLED performance. We studied interfacial changes under each set of driving conditions using XPS (X-Ray Photoelectron Spectroscopy). In addition, we measured the device temperature and brightness. As a result, we found that compared to direct current driving, pulse driving causes less damage to the device interface. In particular, when the pulse frequency is 60 Hz and the duty ratio is 50%, when the pulse frequency is 180 Hz and the duty ratio is 50% and when the pulse frequency is 300 Hz and the duty ratio is 75%, no interfacial changes occur and the brightness is stable. We also found that compared to direct current driving and other driving methods, with pulse driving, the device temperature is lower, enabling reduced energy dissipation into heat.

収録刊行物

• Transactions of the Materials Research Society of Japan

  Transactions of the Materials Research Society of Japan 37 (1), 23-26, 2012

  一般社団法人 日本MRS

キーワード

• OLED
• ITO
• attenuation of brightness
• pulse driving

詳細情報

• CRID: 1390001205512366848
• NII論文ID: 130003399038
• DOI: 10.14723/tmrsj.37.23
• COI: 1:CAS:528:DC%2BC38XntVylurk%3D
• ISSN: 21881650
• ISSN: 13823469
• Web Site: https://www.jstage.jst.go.jp/article/tmrsj/37/1/37_23/_pdf
• 本文言語コード: en
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