The Grain Growth after Light Cold Rolling in Grain-Oriented Silicon-Iron Sheets

  • Nakae Hitoshi
    Tsurumi Research Laboratory, Tokyo-Shibaura Electric Co. Ltd.

抄録

The grain growth after light rolling below 10% in grain-oriented silicon-iron sheets containing 3.50 and 1.43% Si was studied optically and magnetically in order to obtain fundamental data for the establishment of a strain-annealing procedure as a modification of the Goss process. It has been found that, in initially fine-grained sheet specimens, the grain growth increases more prominently at two reduction rates, namely, at 0.5 to 2% and 6 to 7%. Their resulting preferred orientations are different; in the former, a marked development of the Goss texture occurred, possibly involving no primary recrystallization, while in the latter recrystallization from the Goss texture also occurred.<BR>The recrystalization from the Goss texture occurred also on initially coarse-grained specimens. It has been found that the optimum point for producing silicon-iron sheets with high permeability and low hysteresis loss is at the first grain growth maximum of 2% reduction for initially fine-grained sheet specimens.

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