Stress Induced Migration of Symmetric Tilt Boundaries in Aluminum

  • Fukutomi Hiroshi
    Institute of Space and Aeronautical Science, University of Tokyo
  • Horiuchi Ryo
    Institute of Space and Aeronautical Science, University of Tokyo

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Stress induced migration behavior of four kinds of symmetric tilt boundaries which are described as vertical arrays of a⁄2[1\bar10](111) ([11\bar2] tilted), a⁄2[1\bar10](001) ([110] tilted), a⁄2[11\bar2](111) ([1\bar10] tilted), and a[001](010) ([100] tilted) dislocations were investigated by the use of aluminum bicrystals.<BR>It was found that these four kinds of boundaries migrated under stress and produced plastic strain at high temperatures. The migration velocity, v varies with tensile stress, σ and temperature, T, as in the following equation:<BR>v=A(θ,ξ)σnexp(−QRT),<BR>where A(θ, ξ) is a numerical factor depending on the misorientation angle, θ, and the kind of grain boundary dislocations, ξ, n=1.0±0.2 and Q=80±5 kJ/mol when θ is larger than 5°.<BR>Instead of stress induced migration, grain boundary sliding occurred above certain misorientation angles and the transition angles depended on the kind of grain boundary dislocations.

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